• Invited Speakers
Name Affiliation Title
Xiaopeng XuSynopsis, Inc., USAMultiscale thermal, mechanical and performance analysis for 3DIC with HBM
Armen KteyanSiemens EDA, ArmeniaFull-chip CPI assessment for IC performance and reliability with accurate account of thermal effects
Stephane MoreauCEA, FranceHow did the “hybrid bonding” technology become reliable?
Olivier ThomasIM2NP, FranceSynchrotron X-ray light for understanding Ge-rich Ge-Sb-Te materials used as embedded phase change memories in automotive applications (Online)
Kyojin HwangSamsung Electronics Co., Ltd., KoreaNew embedding capacitor solutions for extremely large FC-BGA package platform
Dongwoo HanSK hynix Inc., KoreaMaterial Development Trends for Advanced Package
Bioh Kim, CEOYield Engineering Systems, Inc., KoreaInnovations in Various Process Technologies for Advanced Packaging
Eunsuk Jeon, CEOLaserapps, KoreaNovel singulation of glass substrate for Next generation Advanced semiconductor packaging
Joonho You, CEOnexensor Inc., KoreaThe Study of Optical Measurement Technologies for Advanced Packaging and HBM Process
Yoonjin Kim, CEOTeraon Co., Ltd., KoreaTBD
Myungho (Mike) Lee, COOTechL Co., Ltd., KoreaFlexible PCB for mmWave Antenna Application
Mujin Kim, CTODeepSeers, KoreaSemiconductor Package Inspection: A Comparative Analysis of Machine Vision Techniques for Defect Detection
Jeong Won LeeNepes, KoreaChip-let Heterogeneous Integration packaging based on Fan-out RDL interposer technology
Roland Rettenmeier, Senior ManagerEvatec AG, SwitzerlandTGV for HPC
Kuramochi SatoruDai Nippon Printing (DNP) Co., Ltd., JapanRDL on Glass for High Performance Computing Application
Hiroki IwanagaToshiba Corporation, JapanNovel Eu(III) complexes with an asymmetric diphosphine dioxide ligand and their potential uses in micro-LED displays as red phosphors
Kyung-Ho ParkKorea Advanced Nano Fab Center, KoreaThe Study of the Chemical Mechanical Polishing (CMP) Parameters for Enhanced 3D Cu Hybrid Bonding
Seok Hwan MoonElectronics and Telecommunications Research Institute, KoreaOvercoming the limitations of heat dissipation technology due to high integration and thickness reduction in packaging
Hyunkyu MoonKorea Institute of Machinery and Materials, Korea3D Integration of Thin Die on Curved Surfaces for Optical Applications
RYU ILLSeoul National University, KoreaDefect-Driven Plasticity in Microelectronics under thermal cycles
Hyejin JangSeoul National University, KoreaThermal Transport Properties of Electronics Packaging at the Nanoscale
Sang Won YoonSeoul National University, KoreaConsiderations for Packaging Solutions for Current Automotive Power Modules
Tae-il KimSungkyunkwan University, KoreaPackage for Advanced Bioelectronics
Jungwan ChoSungkyunkwan University, KoreaThermal property measurements using thermoreflectance techniques for device and packaging applications
Sunkook KimSungkyunkwan University, KoreaFlexible Electronics and Sensors
Youngsuk NamKorea Advanced Institute of Science and Technology (KAIST), KoreaEnergy efficient thermal management for AI semiconductors
Hyun ParkDong-A University, KoreaMicrostructure and Elongation of Cu foil fabricated through electrodeposition for Batteries
Young Min SongGwangju Institute of Science and Technology (GIST), KoreaBioinspired advanced camera modules for application-specific vision systems
Seok KimPohang University of Science and Technology (POSTECH), KoreaTransfer Printing for Micro-LED Assembly & Advanced Packaging
Tae Yeob KangThe University of Suwon, KoreaNon-destructive Assessment of Corrosion in Electronic Packages by Processing S-parameters
Tae Young KimSeoul National University of Science and Technology, KoreaTBD
Hyun-Sik KimUniversity of Seoul, KoreaEffect of Y2O3-RE2O3(RE= Nd, Sm, Tb, Dy, Tm)-MgO additives on mechanical and thermal properties of silicon carbide ceramics
Hyeok KimUniversity of Seoul, KoreaOrganic Packaging for Encapsulated Power-free Flexible Devices
Tatsumi HiroakiOsaka University, JapanCu Ribbon Soldering on Power Module Substrate using Blue Diode Laser
Chuantong ChenOsaka University, JapanDevelopment of low temperature Ag-Si composite paste sintering material for high-reliability SiC power modules
Zheng ZhangOsaka University, JapanApplication of Ag cap for fine-pitch Cu pillar interconnection
Munho KimNanyang Technological University, SingaporeWafer bonding and single crystal nanomembrane for flexible electronics
Xinge YuCity University of Hong Kong, Hong KongEngineering of packing materials for permeable wearable electronics
Yunhyeok ImGeorgia Institute of Technology, USATBD
Joon Sang KangKorea Advanced Institute of Science and Technology (KAIST), KoreaHigh thermal conductivity material for thermal management in electronics packaging
Rock KimSiemens EDA, KoreaInnovator3D IC - Siemens EDA's Comprehensive Multiphysics Cockpit for 3D IC design
Debbie Claire SanchezERS electronic GmbH, GermanyYield Improvement in Advanced Packaging through New Photonic Wafer Debonding Technology
Takafumi FukushimaTohoku University, Japan3D-IC and Hybrid Bonding Activity in Tohoku CHIPS
Takayuki MiyoshiToray Engineering Co., Ltd., JapanDemonstration of Flux-less Bonding with Simplified Equipment Configuration
Taku HannaUlvac Inc., JapanPolymer Fine via Formation based upon Plasma Etching Technology for 3D Chiplet Integration
Satoru KuramochiDai Nippon Printing Co., Ltd., JapanLarge Scale Glass substrate for High Performance Computing Application